Question
An n+−n Silicon device is fabricated with uniform and non-degenerate donor doping concentrations of ND1=1×1018cm−3 and ND2=1×1015cm−3 corresponding to the n+ and n regions respectively. At the operational temperature T, assume complete impurity ionization, kT/q=25 mV , and intrinsic carrier concentration to be ni=1×1010cm−3. What is the magnitude of the built-in potential of this device?