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Question

Consider a silicon p-n junction at room temperature having the following parameters:
Doping on the n-side = 1×1017cm3
Depletion width on the n-side = 0.1μm
Depletion width on the p-side = 1.0μm
Intrinsic carrier concentration = 1.4×1010cm3 Thermal voltage = 26 mV
Permittivity of free space = 8.85×1014Fcm1
Dielectric constant of silicon = 12
The peak electric field in the device is

A
1.80MV.cm1, directed from p-region to n-region
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B
0.15MV.cm1, directed from p-region to n-region
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C
0.15MV.cm1, directed from n-region to p-region
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D
1.80MV.cm1, directed from n-region to p-region
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Solution

The correct option is C 0.15MV.cm1, directed from n-region to p-region
Ans : (b)

Electric field,
E=qNoϵ(xw)
At the centre x=0
So, Emax=qNoϵ(Wn)
=1.6×1019×1017×10512×8.85×1014
=0.15 MV/cm

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