Which of the following microscope used an electron beam to magnify the image of the object?
Which of the following microscope used an electron beam to magnify the image of the object?
The correct option is A Both B and C
Electron Microscopes are scientific instruments
that use a beam of highly energetic electrons to examine objects on a very fine
scale.The surface features of an object or "how it looks", its
texture; direct relation between these features and materials properties
(hardness, reflectivity etc.)
The shape and size of the particles making up
the object; direct relation between these structures and materials properties
(ductility, strength, reactivity etc.). The elements and compounds that the
object is composed of and the relative amounts of them; direct relationship
between composition and materials properties (melting point, reactivity,
hardness etc.). How the atoms are arranged in the object; direct relation
between these arrangements and materials properties (conductivity, electrical
properties, strength etc.)
SEM (Scanning Electron Microscope) is used to
characterized the surface morphology, particle size (Not able to measure nano
size powders), EDS (a analysis tool of SEM) used for elemental analysis in your
composition, its able to detect contamination in your composition, you can use it
to view cross-sections of coatings deposit, microstructures, thickness and many
more.
beside TEM is a high resolution tool
(Transmission Electron Microscope) , able analyze at high resolution at nano
level. TEM used to measure nano particles size, measurement of grain size,
crystallite size, atomic arrangement in material, formation of new phases with
very low amount which can not detect by XRD, by using TEM we can detect low
amount (10 %<) phases.So both helps in the magnification of the object.
So,the correct option is ‘D’.
Electron Microscopes are scientific instruments that use a beam of highly energetic electrons to examine objects on a very fine scale.The surface features of an object or "how it looks", its texture; direct relation between these features and materials properties (hardness, reflectivity etc.)
The shape and size of the particles making up the object; direct relation between these structures and materials properties (ductility, strength, reactivity etc.). The elements and compounds that the object is composed of and the relative amounts of them; direct relationship between composition and materials properties (melting point, reactivity, hardness etc.). How the atoms are arranged in the object; direct relation between these arrangements and materials properties (conductivity, electrical properties, strength etc.)
SEM (Scanning Electron Microscope) is used to characterized the surface morphology, particle size (Not able to measure nano size powders), EDS (a analysis tool of SEM) used for elemental analysis in your composition, its able to detect contamination in your composition, you can use it to view cross-sections of coatings deposit, microstructures, thickness and many more.
beside TEM is a high resolution tool (Transmission Electron Microscope) , able analyze at high resolution at nano level. TEM used to measure nano particles size, measurement of grain size, crystallite size, atomic arrangement in material, formation of new phases with very low amount which can not detect by XRD, by using TEM we can detect low amount (10 %<) phases.So both helps in the magnification of the object.
So,the correct option is ‘D’.
